Ключевые слова: coated conductors, fabrication, substrate Hastelloy, buffer layers, ISD process, texture, microstructure
Ключевые слова: HTS, REBCO, tapes, coils, modeling, critical caracteristics, critical current, angular dependence, ISD process, magnetic field dependence, temperature dependence
Ключевые слова: HTS, REBCO, coated conductors, stabilizing layers, mechanical properties, laminations, transverse strain, tensile tests, displacements, measurement technique, comparison, MOCVD process, PLD process, RCE-CDR process, IBAD process, ISD process, microstructure, fracture behavior, experimental results, delamination
Ключевые слова: HTS, coated conductors, texture, buffer layers, ISD process, fabrication, microstructure, X-ray diffraction
Schultz L., Huhne R., Tendeloo G.V., Strickland N.M., Wimbush S.C., Meledin A., Sieger M., Stafford B.H., Ottolinger R.
Eisterer M., Schultz L., Huhne R., Bauer M., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Stafford B.H., Nielsch K., Ottolinger R.
Ключевые слова: presentation, HTS, coated conductors, fabrication, pilot-scale, GdBCO, substrate Hastelloy, ISD process, PVD process, electropolishing process, electron beam evaporation, buffer layers, microstructure, critical caracteristics, critical current, thickness dependence, contact characteristics, protection layer Ag, control systems
Ключевые слова: HTS, coated conductors, fabrication, buffer layers, ISD process, texture, electron beam evaporation
Ключевые слова: HTS, REBCO, coated conductors, microstructure, ISD process, substrate Hastelloy, texture, fabrication
Ключевые слова: HTS, REBCO, doping effect, coated conductors, ISD process, fabrication, electron beam evaporation, microstructure, substrate Hastelloy
Ключевые слова: HTS, REBCO, coated conductors, ISD process, growth rate, critical caracteristics, microstructure, fabrication
Ключевые слова: patents, fabrication, ISD process, HTS, YBCO, coated conductors, buffer layers, deposition setup, substrate metallic
Ключевые слова: HTS, YBCO, coated conductors, anisotropy, current-voltage characteristics, Bi2223/Ag, PIT process, critical current density, grain boundaries, angular dependence, irreversibility fields, comparison, nanoscaled effects, chemical solution deposition, MOD process, MOCVD process, PVD process, IBAD process, ISD process, YBCO, current-voltage characteristics, review, presentation, critical caracteristics, fabrication, magnetic properties
Katagiri K., Kasaba K., Kuroda T., Obara T., Itoh K.(itoh.kikuo@nims.go.jp)
Ключевые слова: HTS, coated conductors, current limiting characteristics, REBCO, ISD process, quench propagation, experimental results, fabrication
Ключевые слова: HTS, REBCO, coated conductors, substrate Hastelloy, mechanical properties, heat treatment, IBAD process, ISD process, YBCO, fabrication, strain effects, experimental results
Ключевые слова: patents, HTS, YBCO, coated conductors, ISD process, fabrication, PLD process, substrate metallic
Nemetschek R., Hoffmann C., Lumkemann A., Sigl G., Prusseit W., Handke J., Kinder H.(h.kinder@lrz.tumuenchen.de)
Ma B., Balachandran U., Xu Y., Efstathiadis H., Bhattacharya R., Lei C.H., Evans H., Manisha R., Massey M.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, ISD process, mechanical properties, tensile tests, stress effects, crack formation, experimental results, fabrication
Ma B., Fisher B.L., Balachandran U., Shankar P.S.(shankar@anl.gov), Singh J.P., Koritala R.
Prusseit W.(prusseit@theva.com), Kinder H., Noe M., Goldacker W., Handke J., Kudymow A.
Nemetschek R., Hoffmann C., Lumkemann A., Sigl G., Prusseit W., Handke J., Kinder H.(h.kinder@lrz.tumuenchen.de)
Prusseit W.(prusseit@theva.com), Nemetschek R., Hoffmann C., Lumkemann A., Kinder H., Sigl G.
Osamura K., Semerad R., Itoh K., Prusseit W., Kiyoshi T., Sugano M.(sugano@kuee.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, REBCO, REBCO, coated conductors, substrate Hastelloy, tensile tests, fracture behavior, ISD process, buffer layers, mechanical properties, critical current, strain effects, stress effects, microstructure, quench properties, fabrication, experimental results, critical caracteristics
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Ключевые слова: HTS, YBCO, coated conductors, mechanical strain, mechanical properties, substrate CeO2/IBAD-YSZ/Ni alloy, ISD process, buffer layers, REBCO, co-evaporation process, protection layer Au, critical current, bending process, stress effects, microstructure, experimental results, critical caracteristics, fabrication
Koritala R.E., Fisher B.L., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U., Berghuis P., Gray K.E., Ma B.(bma@anl.gov), Uprety K.K.
Ma B., Welp U., Gray K.E., Uprety K.K., Veal B.W., Claus H.(claus@anl.gov), Paulikas A.P., Vlasko-Vlasov V.K.
Li M., Koritala R.E., Fisher B.L., Dorris S.E., Balachandran U., Maroni V.A., Zhao X., Ma B.(myli@whu.edu.cn)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, fabrication, texture, microstructure
Li M., Ma B., Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, template layers, fabrication, magnetic properties
Ma B., Koritala R.E., Fisher B.L., Balachandran U., Maroni V.A., Li M.(myli@anl.gov), Venkataraman K.*, Vlasko-Vlasov V., Berghuis P., Welp U., Gray K.E.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, fabrication, microstructure, magnetic properties
Shiohara Y., Izumi T.(izumi@istec.or.jp), Yamada Y.
Li M., Ma B., Koritala R.E., Fisher B.L., Balachandran U.(balu@anl.gov), Dorris S.E., Miller D.J.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, microstructure, experimental results, fabrication, magnetic properties
Varesi E., Petrisor T., Galluzzi V., Rufoloni A., Vannozzi A., Mancini A.(mancini@frascati.enea.it), Celentano G., Fabbri F., Rogai R., Boffa V.(vincenzo.boffa@pirelli.com), Gambardella U.(gamba@sa.infn.it)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, buffer layers, microstructure, experimental results, fabrication, magnetic properties
Fisher B.L., Miller D.J., Balachandran U., Koritala R.E.(koritala@anl.gov), Beihai M., Meiya L.
Ключевые слова: HTS, YBCO, coated conductors, template layers, buffer layers, ISD process, microstructure, fabrication, substrate Ni-V
Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Dorris S.E., Miller D.J., Balachandran U., Meiya L., Beihai M.(bma@anl.gov)
Hobara N., Sato Y., Honjo S., Takahashi Y.(takahashi.yoshihisa@tepco.co.jp), Muranaka K.(muranaka-koji@sei.co.jp), Fujino K.(fujino-koso@)sei.co.jp), Hahakura S.(hahakura-shuji@sei.co.jp), Taneda T.Taneda-akahiro@sei.co.jp), Ohmatsu K., Takei H.(takei-hiromi@sei.co.jp)
Ключевые слова: HTS, REBCO, coated conductors, ISD process, substrate Ni alloy, Jc/B curves, anisotropy, experimental results, critical caracteristics, fabrication
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.